- Title
- Achieving high-bandwidth nanopositioning in presence of plant uncertainties
- Creator
- Aphale, Sumeet S.; Devasia, Santosh; Moheimani, S. O. Reza
- Relation
- 2008 IEEE/ASME International Conference on Advanced Intelligent Mechatronics. Proceedings of the 2008 IEEE/ASME International Conference on Advanced Intelligent Mechatronics (Xi'an, China 2-5 July, 2008) p. 943-948
- Publisher Link
- http://dx.doi.org/10.1109/AIM.2008.4601788
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Resource Type
- conference paper
- Date
- 2008
- Description
- In the absence of plant parameter uncertainties, inversion-based feedforward techniques have been known to deliver accurate tracking performance. Due to changes in operating conditions like ambient temperature, humidity and loading, piezoelectric-stack actuated nanopositioning platforms can undergo significant changes in their system parameters. Nonlinear effects of hysteresis, an inherent property of a piezoelectric actuator, are also present; charge actuation is applied to reduce the effects of hysteresis. In this work, a suitable feedback controller that reduces the effects of parameter uncertainties is integrated with the inversion-based feedforward technique to deliver accurate nanopositioning over a large bandwidth. It is shown experimentally that by integrating closed-loop damping, inversion-based feedforward and charge actuation, the tracking bandwidth of the platform from can be increased significantly from 310 Hz to 1320 Hz.
- Subject
- feedback; feedforward; nanopositioning; high-speed tracking
- Identifier
- uon:6053
- Identifier
- http://hdl.handle.net/1959.13/45173
- Identifier
- ISBN:9781424424955
- Rights
- Copyright © 2008 IEEE. Reprinted from the 2008 IEEE/ASME International Conference on Advanced Intelligent Mechatronics. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of the University of Newcastle's products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.
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